Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Rustem Popa; Constantin Cruceru; Mircea Iliev

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Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Rustem Popa “Dunarea de Jos” University of Galati
Constantin Cruceru “Dunarea de Jos” University of Galati
Mircea Iliev “Dunarea de Jos” University of Galati

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Published

1996-11-30

How to Cite

Popa R, Cruceru C, Iliev M. Uncertainty in testing of open circuit supply faults in CMOS logic circuits. The Annals of “Dunarea de Jos“ University of Galati. Fascicle III, Electrotechnics, Electronics, Automatic Control, Informatics [Internet]. 30Nov.1996 [cited 26Apr.2025];19:44-7. Available from: https://gup.ugal.ro/ugaljournals/index.php/eeaci/article/view/853

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Vol 19 (1996)

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Articles

@ "Dunarea de Jos" University of Galati

Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Abstract

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