Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Rustem Popa; Constantin Cruceru; Mircea Iliev

Skip to main content Skip to main navigation menu Skip to site footer

Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Rustem Popa “Dunarea de Jos” University of Galati
Constantin Cruceru “Dunarea de Jos” University of Galati
Mircea Iliev “Dunarea de Jos” University of Galati

Abstract

Abstract and full text available only in printed form

Downloads

Download data is not yet available.

Published

1996-11-30

How to Cite

Popa R, Cruceru C, Iliev M. Uncertainty in testing of open circuit supply faults in CMOS logic circuits. The Annals of “Dunarea de Jos“ University of Galati. Fascicle III, Electrotechnics, Electronics, Automatic Control, Informatics [Internet]. 30Nov.1996 [cited 4Nov.2025];19:44-7. Available from: https://gup.ugal.ro/ugaljournals/index.php/eeaci/article/view/853

Download Citation

Issue

Vol 19 (1996)

Section

Articles

@ "Dunarea de Jos" University of Galati

Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Abstract

Downloads

Most read articles by the same author(s)