Influence of substrate temperature on the structural and optical properties of ZnSe thin films

Abstract

ZnSe thin films were deposited onto glass substrates by vacuum thermal evaporation technique. The substrate temperature was varied from 300 K to 473 K. The films structure was studied by means of X-ray diffraction technique (XRD). The film crystallites present a preferential orientation with the (111) planes parallel to the substrate surface. The surface morphology was investigated by vertical scanning interferometry (VSI). The surface roughness parameters of thin films were calculated. The optical properties of ZnSe thin films were investigated using spectrophotometric measurements of transmittance and reflectance in the 275-1100 nm wavelength range.